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Extraction of the Back Channel Mobility in SOI Nanowire MOS..:
, In:
2022 IEEE Latin American Electron Devices Conference (LAEDC)
,
Bergamaschi, Flavio E.
;
Wirth, Gilson I.
;
Barraud, Sylvain
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/LAEDC54796.2022.9908214
RT T1
2022 IEEE Latin American Electron Devices Conference (LAEDC)
: T1
Extraction of the Back Channel Mobility in SOI Nanowire MOS Transistors under Substrate Biasing
UL https://suche.suub.uni-bremen.de/peid=ieee-9908214&Exemplar=1&LAN=DE A1 Bergamaschi, Flavio E. A1 Wirth, Gilson I. A1 Barraud, Sylvain A1 Casse, Mikael A1 Vinet, Maud A1 Faynot, Olivier A1 Pavanello, Marcelo A. YR 2022 K1 Performance evaluation K1 MOSFET K1 Solid modeling K1 Logic gates K1 Length measurement K1 Nanoscale devices K1 Electron devices K1 carrier mobility K1 nanowire MOS transistor K1 substrate bias SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/LAEDC54796.2022.9908214 DO https://doi.org/10.1109/LAEDC54796.2022.9908214 SF ELIB - SuUB Bremen
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