I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Parameter extraction in a 65nm nMOSFET technology from 300 ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Lopez-L, O. ; Martinez-R, I. ; Durini, D.... - p. 1-4 , 2022
Link: https://doi.org/10.1109/LAEDC54796.2022.9908221