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1 Ergebnisse
1
Investigation of the Statistical Spread of the Time-Depende..:
, In:
2022 IEEE Latin American Electron Devices Conference (LAEDC)
,
Malavena, G.
;
Mazzola, J. L.
;
Greatti, M.
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/LAEDC54796.2022.9908226
RT T1 <cTitle>2022 IEEE Latin American Electron Devices Conference (LAEDC)</cTitle>: T1 <Title>Investigation of the Statistical Spread of the Time-Dependent Dielectric Breakdown in Polymeric Dielectrics for Galvanic Isolation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9908226&Exemplar=1&LAN=DE A1 Malavena, G. A1 Mazzola, J. L. A1 Greatti, M. A1 Compagnoni, C. Monzio A1 Lacaita, A. L. A1 Marano, V. A1 Lauria, M. A1 Paci, D. A1 Speroni, F. A1 Spinelli, A. S. YR 2022 K1 Degradation K1 Performance evaluation K1 Nonuniform electric fields K1 Monte Carlo methods K1 Materials reliability K1 Dielectrics K1 Dielectric breakdown K1 Time-Dependent Dielectric Breakdown (TDDB) K1 dielectric reliability K1 TDDB variability K1 percolation SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/LAEDC54796.2022.9908226 DO https://doi.org/10.1109/LAEDC54796.2022.9908226 SF ELIB - SuUB Bremen
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