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Statistical measurements and Monte-Carlo simulations of DCR..:

, In: ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC),

Sicre, Mathieu ; Agnew, Megan ; Buj, Christel... - p. 193-196 , 2022

Link: https://doi.org/10.1109/ESSCIRC55480.2022.9911519

RT 
T1 <cTitle>ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC)</cTitle>: T1 <Title>Statistical measurements and Monte-Carlo simulations of DCR in SPADs</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9911519&Exemplar=1&LAN=DE
				
A1 Sicre, Mathieu
A1 Agnew, Megan
A1 Buj, Christel
A1 Coutier, Caroline
A1 Golanski, Dominique
A1 Helleboid, Remi
A1 Mamdy, Bastien
A1 Nicholson, Isobel
A1 Pellegrini, Sara
A1 Rideau, Denis
A1 Roy, David
A1 Calmon, Francis
YR 2022
K1 Temperature measurement
K1 Semiconductor device modeling
K1 Temperature distribution
K1 Voltage measurement
K1 Monte Carlo methods
K1 Computational modeling
K1 Stochastic processes
K1 Single-Photon Avalanche Diode (SPAD)
K1 avalanche breakdown probability
K1 Dark Count Rate (DCR)
K1 Technology Computer Aided Design (TCAD)
K1 defects
K1 thermal activation energy
K1 Empirical Monte-Carlo
K1 statistical analysis
SP 193
OP 196
LK http://dx.doi.org/https://doi.org/10.1109/ESSCIRC55480.2022.9911519
DO https://doi.org/10.1109/ESSCIRC55480.2022.9911519
SF ELIB - SuUB Bremen

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