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Towards Yield Improvement for AI Accelerators: Analysis and..:
, In:
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
,
Charrwi, Mohammad Walid
;
Phan, Huy
;
Yuan, Bo
. - p. 339-344 , 2022
Link:
https://doi.org/10.1109/ISVLSI54635.2022.00075
RT T1 <cTitle>2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)</cTitle>: T1 <Title>Towards Yield Improvement for AI Accelerators: Analysis and Exploration</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9911952&Exemplar=1&LAN=DE A1 Charrwi, Mohammad Walid A1 Phan, Huy A1 Yuan, Bo A1 Saeed, Samah Mohamed YR 2022 SN 2159-3477 K1 Fault diagnosis K1 Fabrication K1 AI accelerators K1 Computer architecture K1 Automatic test pattern generation K1 Very large scale integration K1 Systolic arrays K1 Systolic array K1 Processing Element (PE) K1 Testing K1 Critical faults K1 Benign faults K1 Yield K1 Artificial Intelligence (AI) SP 339 OP 344 LK http://dx.doi.org/https://doi.org/10.1109/ISVLSI54635.2022.00075 DO https://doi.org/10.1109/ISVLSI54635.2022.00075 SF ELIB - SuUB Bremen
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