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2 Ergebnisse
1
Abbreviated tomography techniques for quick correction of s..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Lee, Hee-Beom
;
Ishimaru, Masahiro
;
McPhillips, John
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915708
2
Abbreviated tomography techniques for quick correction of s..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Lee, Hee-Beom
;
Ishimaru, Masahiro
;
McPhillips, John
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915708
RT T1 <cTitle>2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)</cTitle>: T1 <Title>Abbreviated tomography techniques for quick correction of slides in 3-Dimensional NAND Flash architectures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9915708&Exemplar=1&LAN=DE A1 Lee, Hee-Beom A1 Ishimaru, Masahiro A1 McPhillips, John A1 Alvis, Roger L. A1 Johnson, Timothy A. A1 Kang, Christopher H. A1 Choi, Inchang A1 Cho, Youngjin A1 Choi, Kiju YR 2022 SN 1946-1550 K1 Integrated circuits K1 Three-dimensional displays K1 Tomography K1 Ions K1 Etching K1 Reliability K1 Flash memories K1 correction K1 data reconstruction K1 distortion K1 focused ion beam K1 tomography SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915708 DO https://doi.org/10.1109/IPFA55383.2022.9915708 SF ELIB - SuUB Bremen RT T1 <cTitle>2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)</cTitle>: T1 <Title>Abbreviated tomography techniques for quick correction of slides in 3-Dimensional NAND Flash architectures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9915708&Exemplar=1&LAN=DE A1 Lee, Hee-Beom A1 Ishimaru, Masahiro A1 McPhillips, John A1 Alvis, Roger L. A1 Johnson, Timothy A. A1 Kang, Christopher H. A1 Choi, Inchang A1 Cho, Youngjin A1 Choi, Kiju YR 2022 SN 1946-1550 K1 Integrated circuits K1 Three-dimensional displays K1 Tomography K1 Ions K1 Etching K1 Reliability K1 Flash memories K1 correction K1 data reconstruction K1 distortion K1 focused ion beam K1 tomography SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915708 DO https://doi.org/10.1109/IPFA55383.2022.9915708 SF ELIB - SuUB Bremen
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