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1 Ergebnisse
1
Novel and Simple Cross-sectional FIB Circuit Edit Technique..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Tan, P. K.
;
Pan, Y. L.
;
Ting, S. L.
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915711
RT T1
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Novel and Simple Cross-sectional FIB Circuit Edit Techniques for Circuit Isolation
UL https://suche.suub.uni-bremen.de/peid=ieee-9915711&Exemplar=1&LAN=DE A1 Tan, P. K. A1 Pan, Y. L. A1 Ting, S. L. A1 Quah, A. C. T. A1 Tam, Y. S. A1 Teo, Angela A1 Xu, N. Y. A1 Thoungh, H. H. W. A1 Kang, K. K. A1 Yu, T. T. A1 Chen, C. Q. YR 2022 SN 1946-1550 K1 Workability K1 Radio frequency K1 Prototypes K1 Failure analysis K1 Milling K1 Silicon K1 Standards K1 FIB-CE K1 Circuit Edit K1 cross-sectional FIB K1 circuit isolation K1 XFIB-CE SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915711 DO https://doi.org/10.1109/IPFA55383.2022.9915711 SF ELIB - SuUB Bremen
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