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Novel and Simple Cross-sectional FIB Circuit Edit Technique..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Tan, P. K. ; Pan, Y. L. ; Ting, S. L.... - p. 1-6 , 2022
Link: https://doi.org/10.1109/IPFA55383.2022.9915711