I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Logo Detection and Localization for IC Authentication, Mark..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Sathiaseelan, Mukhil Azhagan Mallaiyan
;
Vutukuru, Manoj Yasaswi
;
Ghosh, Shajib
... - p. 1-7 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915713
RT T1
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Logo Detection and Localization for IC Authentication, Marking Recognition, and Counterfeit Detection
UL https://suche.suub.uni-bremen.de/peid=ieee-9915713&Exemplar=1&LAN=DE A1 Sathiaseelan, Mukhil Azhagan Mallaiyan A1 Vutukuru, Manoj Yasaswi A1 Ghosh, Shajib A1 Paradis, Olivia P. A1 Tehranipoor, Mark A1 Asadizanjani, Navid A1 Crandall, David YR 2022 SN 1946-1550 K1 Integrated circuits K1 Measurement K1 Text recognition K1 Printed circuits K1 Neural networks K1 Object detection K1 Hardware K1 PCB assurance K1 hardware assurance K1 logo detection K1 text detection K1 counterfeit avoidance K1 AutoBoM SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915713 DO https://doi.org/10.1109/IPFA55383.2022.9915713 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)