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1 Ergebnisse
1
Logo Detection and Localization for IC Authentication, Mark..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Sathiaseelan, Mukhil Azhagan Mallaiyan
;
Vutukuru, Manoj Yasaswi
;
Ghosh, Shajib
... - p. 1-7 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915713
RT T1 <cTitle>2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)</cTitle>: T1 <Title>Logo Detection and Localization for IC Authentication, Marking Recognition, and Counterfeit Detection</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9915713&Exemplar=1&LAN=DE A1 Sathiaseelan, Mukhil Azhagan Mallaiyan A1 Vutukuru, Manoj Yasaswi A1 Ghosh, Shajib A1 Paradis, Olivia P. A1 Tehranipoor, Mark A1 Asadizanjani, Navid A1 Crandall, David YR 2022 SN 1946-1550 K1 Integrated circuits K1 Measurement K1 Text recognition K1 Printed circuits K1 Neural networks K1 Object detection K1 Hardware K1 PCB assurance K1 hardware assurance K1 logo detection K1 text detection K1 counterfeit avoidance K1 AutoBoM SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915713 DO https://doi.org/10.1109/IPFA55383.2022.9915713 SF ELIB - SuUB Bremen
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