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LADA methodologies to localize embedded memory failure:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Yeoh, BL ; Thor, MH ; Gan, LS.. - p. 1-6 , 2022
Link: https://doi.org/10.1109/IPFA55383.2022.9915715