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Internal Power Net Defect Localization Via Holistic Fault I..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Lau, Kok Heng ; Liew, Chiun Ning ; Goh, Lay Lay.. - p. 1-5 , 2022
Link: https://doi.org/10.1109/IPFA55383.2022.9915717