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Physical origin of the permanent components of the positive..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Palumbo, Felix ; Klebanov, Maxim ; Monreal, Gerardo. - p. 1-5 , 2022
Link: https://doi.org/10.1109/IPFA55383.2022.9915732