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1 Ergebnisse
1
Semantic-Masked Intensity Augmentation for Deep Learning-ba..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Cheng, Deruo
;
Tee, Yee-Yang
;
Song, Jingsi
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915735
RT T1 <cTitle>2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)</cTitle>: T1 <Title>Semantic-Masked Intensity Augmentation for Deep Learning-based Analysis of FPGA Images</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9915735&Exemplar=1&LAN=DE A1 Cheng, Deruo A1 Tee, Yee-Yang A1 Song, Jingsi A1 Shi, Yiqiong A1 Lin, Tong A1 Gwee, Bah-Hwee YR 2022 SN 1946-1550 K1 Deep learning K1 Image segmentation K1 Analytical models K1 Microscopy K1 Semantics K1 Metals K1 Stability analysis K1 FPGA analysis K1 deep learning K1 data augmentation SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915735 DO https://doi.org/10.1109/IPFA55383.2022.9915735 SF ELIB - SuUB Bremen
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