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Effective Defect Localization for Scan ATPG Failure through..:

, In: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Ng, Jack Yi Jie ; Lau, Kok Heng ; Liew, Chiun Ning... - p. 1-4 , 2022
Link: https://doi.org/10.1109/IPFA55383.2022.9915736