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1 Ergebnisse
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Supervised Image Retrieval and Ranking Technique for Lock-i..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Tan, Rui Zhen
;
Venkatarayalu, Neelakantam
;
Atmosukarto, Indriyati
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915757
RT T1
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Supervised Image Retrieval and Ranking Technique for Lock-in Thermography Images
UL https://suche.suub.uni-bremen.de/peid=ieee-9915757&Exemplar=1&LAN=DE A1 Tan, Rui Zhen A1 Venkatarayalu, Neelakantam A1 Atmosukarto, Indriyati A1 Premkumar, A. B. A1 Teh, Tict Eng A1 Thinn, Kyu Kyu A1 Xue, Ming YR 2022 SN 1946-1550 K1 Integrated circuits K1 Measurement K1 Visualization K1 Databases K1 Image retrieval K1 Failure analysis K1 Feature extraction K1 Lock-in Thermography K1 image search K1 failure analysis K1 image classification K1 transfer learning K1 image ranking SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915757 DO https://doi.org/10.1109/IPFA55383.2022.9915757 SF ELIB - SuUB Bremen
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