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1 Ergebnisse
1
Comprehensive Investigation of the Switching Stability in S..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Tang, Shun-Wei
;
Fan, Chao-Ta
;
Lin, Ming-Cheng
. - p. 1-5 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915772
RT T1
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Comprehensive Investigation of the Switching Stability in SiC and GaN Power Devices
UL https://suche.suub.uni-bremen.de/peid=ieee-9915772&Exemplar=1&LAN=DE A1 Tang, Shun-Wei A1 Fan, Chao-Ta A1 Lin, Ming-Cheng A1 Wu, Tian-Li YR 2022 SN 1946-1550 K1 Temperature dependence K1 Silicon carbide K1 Switches K1 Voltage K1 Zero voltage switching K1 Stability analysis K1 Circuit stability K1 Switching stability K1 power devices K1 dynamic Rdson K1 zero voltage switching K1 hard switching SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915772 DO https://doi.org/10.1109/IPFA55383.2022.9915772 SF ELIB - SuUB Bremen
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