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Failure analysis on MIMCAP failures of 10nm devices using p..:
, In:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Li khoo, Hsu
;
Goh, Lay Lay
;
G, Yi Jie N
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/IPFA55383.2022.9915778
RT T1
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Failure analysis on MIMCAP failures of 10nm devices using phase angle measurement method
UL https://suche.suub.uni-bremen.de/peid=ieee-9915778&Exemplar=1&LAN=DE A1 Li khoo, Hsu A1 Goh, Lay Lay A1 G, Yi Jie N A1 Lau, Kok Heng A1 Liew, Chiun Ning A1 Lim, Siew Ming YR 2022 SN 1946-1550 K1 Integrated circuits K1 Resistance K1 Performance evaluation K1 Phase measurement K1 Metals K1 Failure analysis K1 Optical variables measurement K1 MIMCAP K1 IV and ELITE/OBIRCH analysis K1 PFA SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA55383.2022.9915778 DO https://doi.org/10.1109/IPFA55383.2022.9915778 SF ELIB - SuUB Bremen
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