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1 Ergebnisse
1
Understanding ionizing energy losses after charged particle..:
, In:
2022 International Conference on Applied Electronics (AE)
,
Bergmann, Benedikt
- p. 1-4 , 2022
Link:
https://doi.org/10.1109/AE54730.2022.9920076
RT T1
2022 International Conference on Applied Electronics (AE)
: T1
Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors
UL https://suche.suub.uni-bremen.de/peid=ieee-9920076&Exemplar=1&LAN=DE A1 Bergmann, Benedikt YR 2022 SN 1805-9597 SN 1803-7232 K1 Energy loss K1 IEL K1 Graphical models K1 Radiation detectors K1 Detectors K1 Neutrons K1 Silicon K1 neutron radiation K1 radiation damage K1 pixel detectors K1 non-ionizing energy losses (NIEL) K1 ionizing energy losses (IEL) K1 particle detectors SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/AE54730.2022.9920076 DO https://doi.org/10.1109/AE54730.2022.9920076 SF ELIB - SuUB Bremen
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