I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Understanding ionizing energy losses after charged particle..:
, In:
2022 International Conference on Applied Electronics (AE)
,
Bergmann, Benedikt
- p. 1-4 , 2022
Link:
https://doi.org/10.1109/AE54730.2022.9920076
RT T1 <cTitle>2022 International Conference on Applied Electronics (AE)</cTitle>: T1 <Title>Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9920076&Exemplar=1&LAN=DE A1 Bergmann, Benedikt YR 2022 SN 1805-9597 SN 1803-7232 K1 Energy loss K1 IEL K1 Graphical models K1 Radiation detectors K1 Detectors K1 Neutrons K1 Silicon K1 neutron radiation K1 radiation damage K1 pixel detectors K1 non-ionizing energy losses (NIEL) K1 ionizing energy losses (IEL) K1 particle detectors SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/AE54730.2022.9920076 DO https://doi.org/10.1109/AE54730.2022.9920076 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
