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Impact Analysis of KPI Scenarios, Automated Best Practices ..:
, In:
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)
,
Lopes, Maria J.
;
Rocha, Eugenio M.
- p. 1-6 , 2022
Link:
https://doi.org/10.1109/ETFA52439.2022.9921462
RT T1 <cTitle>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</cTitle>: T1 <Title>Impact Analysis of KPI Scenarios, Automated Best Practices Identification, and Deviations on Manufacturing Processes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9921462&Exemplar=1&LAN=DE A1 Lopes, Maria J. A1 Rocha, Eugenio M. YR 2022 K1 Root cause analysis K1 Manufacturing processes K1 Uncertainty K1 Statistical analysis K1 Key performance indicator K1 Production K1 Stability analysis K1 Impact metrics K1 continuous improvement K1 industry 4.0 K1 process deviations K1 root cause analysis SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ETFA52439.2022.9921462 DO https://doi.org/10.1109/ETFA52439.2022.9921462 SF ELIB - SuUB Bremen
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