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Single Event Upset and Total Ionizing Dose Response of 12LP..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),

Neuendank, Jereme ; Spear, Matthew ; Wallace, Trace... - p. 1-9 , 2022

Link: https://doi.org/10.1109/REDW56037.2022.9921478

RT 
T1 <cTitle>2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)</cTitle>: T1 <Title>Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-9921478&Exemplar=1&LAN=DE
				
A1 Neuendank, Jereme
A1 Spear, Matthew
A1 Wallace, Trace
A1 Wilson, Donald
A1 Solano, Jose
A1 Irumva, Gedeon
A1 Esqueda, Ivan Sanchez
A1 Barnaby, Hugh J.
A1 Clark, Lawrence T.
A1 Brunhaver, John
A1 Turowski, Marek
A1 Mikkola, Esko
A1 Hughart, David
A1 Young, Joshua
A1 Manuel, Jack
A1 Agarwal, Sapan
A1 Vaandrager, Bastiaan
A1 Vizkelethy, Gyorgy
A1 Gutierrez, Amos
A1 Trippe, James
A1 King, Michael
A1 Bielejec, Edward
A1 Marinella, Matthew
YR 2022
SN 2154-0535
K1 Laboratories
K1 Single event upsets
K1 Gamma-rays
K1 Ion sources
K1 FinFETs
K1 Silicon
K1 Inverters
K1 FinFET
K1 total ionizing dose
K1 single event upset
K1 digital flip-flop
SP 1
OP 9
LK http://dx.doi.org/https://doi.org/10.1109/REDW56037.2022.9921478
DO https://doi.org/10.1109/REDW56037.2022.9921478
SF ELIB - SuUB Bremen

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