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1
A Study of Neutron Induced Single-Event Damage in AlGaN/GaN..:
, In:
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)
,
Gao, Han
;
Ahsanullah, Danyal
;
Baumann, Robert
. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/REDW56037.2022.9921516
RT T1
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)
: T1
A Study of Neutron Induced Single-Event Damage in AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-9921516&Exemplar=1&LAN=DE A1 Gao, Han A1 Ahsanullah, Danyal A1 Baumann, Robert A1 Gnade, Bruce YR 2022 SN 2154-0535 K1 Radiation effects K1 Extrapolation K1 Neutrons K1 HEMTs K1 Logic gates K1 Wide band gap semiconductors K1 Dielectrics K1 AlGaN/GaN HEMT K1 terrestrial neutrons K1 cosmic-ray neutrons K1 destructive single events effects K1 single-event gate rupture K1 single-event burnout K1 gate dielectric degradation K1 FIT rate SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/REDW56037.2022.9921516 DO https://doi.org/10.1109/REDW56037.2022.9921516 SF ELIB - SuUB Bremen
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