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Total Ionizing Dose Response of Commercial 22nm FD-SOI CMOS..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),
Solano, Jose ; Spear, Matthew ; Wallace, Trace... - p. 1-5 , 2022
Link: https://doi.org/10.1109/REDW56037.2022.9921673