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1 Ergebnisse
1
Checking Rollett's Proviso for Degenerated Devices through ..:
, In:
2022 17th European Microwave Integrated Circuits Conference (EuMIC)
,
Colangeli, Sergio
;
Longhi, Patrick E.
;
Ciccognani, Walter
.. - p. 236-239 , 2022
Link:
https://doi.org/10.23919/EuMIC54520.2022.9923453
RT T1 <cTitle>2022 17th European Microwave Integrated Circuits Conference (EuMIC)</cTitle>: T1 <Title>Checking Rollett's Proviso for Degenerated Devices through S-Parameter Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9923453&Exemplar=1&LAN=DE A1 Colangeli, Sergio A1 Longhi, Patrick E. A1 Ciccognani, Walter A1 Serino, Antonio A1 Limiti, Ernesto YR 2022 K1 Microwave integrated circuits K1 Europe K1 Microwave devices K1 Microwave theory and techniques K1 Microwave circuits K1 Stability analysis K1 Circuit stability K1 Ohtomo's test K1 Rollett's proviso K1 small-signal stability SP 236 OP 239 LK http://dx.doi.org/https://doi.org/10.23919/EuMIC54520.2022.9923453 DO https://doi.org/10.23919/EuMIC54520.2022.9923453 SF ELIB - SuUB Bremen
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