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1 Ergebnisse
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IDLD: Instantaneous Detection of Leakage and Duplication of..:
, In:
2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO)
,
Sazeides, Yiannakis
;
Gerber, Alex
;
Gabor, Ron
... - p. 799-814 , 2022
Link:
https://doi.org/10.1109/MICRO56248.2022.00061
RT T1 <cTitle>2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO)</cTitle>: T1 <Title>IDLD: Instantaneous Detection of Leakage and Duplication of Identifiers used for Register Renaming</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9923792&Exemplar=1&LAN=DE A1 Sazeides, Yiannakis A1 Gerber, Alex A1 Gabor, Ron A1 Bramnik, Arkady A1 Papadimitriou, George A1 Gizopoulos, Dimitris A1 Nicopoulos, Chrysostomos A1 Dimitrakopoulos, Giorgos A1 Patsidis, Karyofyllis YR 2022 K1 Out of order K1 Microarchitecture K1 Computer bugs K1 Modems K1 Hardware K1 Registers K1 Object recognition K1 Post-silicon validation K1 register renaming K1 merged register file K1 microarchitecture K1 pipeline K1 design bugs SP 799 OP 814 LK http://dx.doi.org/https://doi.org/10.1109/MICRO56248.2022.00061 DO https://doi.org/10.1109/MICRO56248.2022.00061 SF ELIB - SuUB Bremen
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