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1 Ergebnisse
1
PN Junctions Interface Passivation in 22 nm FDSOI for Low-L..:
, In:
2022 24th International Microwave and Radar Conference (MIKON)
,
Nyssens, L.
;
Rack, M.
;
Nabet, M.
... - p. 1-4 , 2022
Link:
https://doi.org/10.23919/MIKON54314.2022.9924803
RT T1 <cTitle>2022 24th International Microwave and Radar Conference (MIKON)</cTitle>: T1 <Title>PN Junctions Interface Passivation in 22 nm FDSOI for Low-Loss Passives</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9924803&Exemplar=1&LAN=DE A1 Nyssens, L. A1 Rack, M. A1 Nabet, M. A1 Schwan, C. A1 Zhao, Z. A1 Lehmann, S. A1 Herrmann, T. A1 Henke, D. A1 Kondrat, A. A1 Soonekindt, C. A1 Koch, F. A1 Kache, T. A1 Kini, D. P. A1 Zimmerhackl, O. A1 Allibert, F. A1 Aulnette, C. A1 Lederer, D. A1 Raskin, J.-P. YR 2022 K1 Q-factor K1 Metals K1 Conductivity K1 Propagation losses K1 Coplanar waveguides K1 Junctions K1 Inductors K1 FD-SOI K1 High-Resistivity K1 Parasitic Surface Conduction K1 PN junctions K1 Effective Resistivity K1 CPW line K1 TFMS line K1 Spiral Inductor SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.23919/MIKON54314.2022.9924803 DO https://doi.org/10.23919/MIKON54314.2022.9924803 SF ELIB - SuUB Bremen
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