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1 Ergebnisse
1
Polarimetry For Nickel-Chromium Two-Layer Nanofilms And Nic..:
, In:
2022 IEEE 41st International Conference on Electronics and Nanotechnology (ELNANO)
,
Oberemok, Yevgen
;
Savenkov, Sergey
;
Xiaohong, Chen
... - p. 224-227 , 2022
Link:
https://doi.org/10.1109/ELNANO54667.2022.9927127
RT T1 <cTitle>2022 IEEE 41st International Conference on Electronics and Nanotechnology (ELNANO)</cTitle>: T1 <Title>Polarimetry For Nickel-Chromium Two-Layer Nanofilms And Nickel Nanostripe On A Glass Substrate</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9927127&Exemplar=1&LAN=DE A1 Oberemok, Yevgen A1 Savenkov, Sergey A1 Xiaohong, Chen A1 Zheniie, Zhao A1 Zhuo, Sun A1 Sizhuk, Andrii A1 Malyshev, Vladimir A1 Yakimov, Konstantin A1 Prokopenko, Oleksandr A1 Rodionova, Tetjana YR 2022 SN 2693-3535 K1 Refractive index K1 Glass K1 Chromium K1 Conductivity K1 Nonhomogeneous media K1 Nickel K1 Reflection K1 nanostripes K1 polarimetry K1 antiferromagnetic-ferromagnetic K1 refractive index K1 interface SP 224 OP 227 LK http://dx.doi.org/https://doi.org/10.1109/ELNANO54667.2022.9927127 DO https://doi.org/10.1109/ELNANO54667.2022.9927127 SF ELIB - SuUB Bremen
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