I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
A Framework for Fault Tolerance in RISC-V:
, In:
2022 IEEE Intl Conf on Dependable, Autonomic and Secure Computing, Intl Conf on Pervasive Intelligence and Computing, Intl Conf on Cloud and Big Data Computing, Intl Conf on Cyber Science and Technology Congress (DASC/PiCom/CBDCom/CyberSciTech)
,
Dorflinger, Alexander
;
Kleinbeck, Benedikt
;
Albers, Mark
.. - p. 1-8 , 2022
Link:
https://doi.org/10.1109/DASC/PiCom/CBDCom/Cy55231.2022..
RT T1
2022 IEEE Intl Conf on Dependable, Autonomic and Secure Computing, Intl Conf on Pervasive Intelligence and Computing, Intl Conf on Cloud and Big Data Computing, Intl Conf on Cyber Science and Technology Congress (DASC/PiCom/CBDCom/CyberSciTech)
: T1
A Framework for Fault Tolerance in RISC-V
UL https://suche.suub.uni-bremen.de/peid=ieee-9927800&Exemplar=1&LAN=DE A1 Dorflinger, Alexander A1 Kleinbeck, Benedikt A1 Albers, Mark A1 Michalik, Harald A1 Moya, Martin YR 2022 K1 Program processors K1 Costs K1 Microcontrollers K1 Fault tolerant systems K1 Redundancy K1 Detectors K1 Software K1 Error Correction Codes K1 Fault Injection K1 Permanent Errors K1 Transient Errors SP 1 OP 8 LK http://dx.doi.org/https://doi.org/10.1109/DASC/PiCom/CBDCom/Cy55231.2022.9927800 DO https://doi.org/10.1109/DASC/PiCom/CBDCom/Cy55231.2022.9927800 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)