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1 Ergebnisse
1
A Comparison between Low Impedance Contact CDM and Field In..:
, In:
2022 44th Annual EOS/ESD Symposium (EOS/ESD)
,
Park, Junsik
;
Kim, Heesu
;
Yoon, Dong-Gwan
... - p. 1-6 , 2022
Link:
https://doi.org/10.23919/EOS/ESD54763.2022.9928519
RT T1
2022 44th Annual EOS/ESD Symposium (EOS/ESD)
: T1
A Comparison between Low Impedance Contact CDM and Field Induced CDM: Measurement and Simulation
UL https://suche.suub.uni-bremen.de/peid=ieee-9928519&Exemplar=1&LAN=DE A1 Park, Junsik A1 Kim, Heesu A1 Yoon, Dong-Gwan A1 Kang, Bong-Gyu A1 Jang, Youngsoo A1 Kim, Namsu A1 Kim, Kyungsuk A1 Ku, Youngmin YR 2022 K1 Solid modeling K1 Correlation K1 Impedance measurement K1 Three-dimensional displays K1 Current measurement K1 Circuit simulation K1 Reconstruction algorithms SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.23919/EOS/ESD54763.2022.9928519 DO https://doi.org/10.23919/EOS/ESD54763.2022.9928519 SF ELIB - SuUB Bremen
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