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1 Ergebnisse
1
Photoelectric Characterization of a Single Layer of CNTs us..:
, In:
2022 IEEE 22nd International Conference on Nanotechnology (NANO)
,
Abbas, Y.
;
Baker, M.
;
Rezeq, M.
- p. 186-189 , 2022
Link:
https://doi.org/10.1109/NANO54668.2022.9928657
RT T1
2022 IEEE 22nd International Conference on Nanotechnology (NANO)
: T1
Photoelectric Characterization of a Single Layer of CNTs using CAFM
UL https://suche.suub.uni-bremen.de/peid=ieee-9928657&Exemplar=1&LAN=DE A1 Abbas, Y. A1 Baker, M. A1 Rezeq, M. YR 2022 SN 1944-9380 K1 Atomic measurements K1 Atomic force microscopy K1 Scanning electron microscopy K1 Wavelength measurement K1 Force K1 Electric variables K1 Carbon nanotubes SP 186 OP 189 LK http://dx.doi.org/https://doi.org/10.1109/NANO54668.2022.9928657 DO https://doi.org/10.1109/NANO54668.2022.9928657 SF ELIB - SuUB Bremen
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