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1 Ergebnisse
1
Optimized Junction Termination Extension and Ring System fo..:
, In:
2022 International Semiconductor Conference (CAS)
,
Ammar, Ali
;
Lazar, Mihai
;
Vergne, Bertr
... - p. 191-194 , 2022
Link:
https://doi.org/10.1109/CAS56377.2022.9934390
RT T1 <cTitle>2022 International Semiconductor Conference (CAS)</cTitle>: T1 <Title>Optimized Junction Termination Extension and Ring System for 11 kV 4H-SiC BJT</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9934390&Exemplar=1&LAN=DE A1 Ammar, Ali A1 Lazar, Mihai A1 Vergne, Bertr A1 Scharnholz, Sigo A1 Phung, Luong Viet A1 Sonneville, Camille A1 Raynaud, Christophe A1 Morel, Herve A1 Planson, Dominique A1 Zielinski, Marcin YR 2022 SN 2377-0678 K1 Performance evaluation K1 Optical design K1 Optical device fabrication K1 Temperature control K1 Leakage currents K1 Junctions K1 Current density K1 Bipolar Devices K1 4H-SiC BJT K1 blocking voltage K1 I- V characteristics K1 TCAD modeling SP 191 OP 194 LK http://dx.doi.org/https://doi.org/10.1109/CAS56377.2022.9934390 DO https://doi.org/10.1109/CAS56377.2022.9934390 SF ELIB - SuUB Bremen
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