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A Raman spectroscopy focused study of the metal dopant effe..:
, In:
2022 International Semiconductor Conference (CAS)
,
Pachiu, C.
;
Pascariu, P.
;
Tudose, I.V.
. - p. 239-242 , 2022
Link:
https://doi.org/10.1109/CAS56377.2022.9934395
RT T1
2022 International Semiconductor Conference (CAS)
: T1
A Raman spectroscopy focused study of the metal dopant effect on ZnO nanostructured thin films
UL https://suche.suub.uni-bremen.de/peid=ieee-9934395&Exemplar=1&LAN=DE A1 Pachiu, C. A1 Pascariu, P. A1 Tudose, I.V. A1 Suchea, M.P. YR 2022 SN 2377-0678 K1 Spectroscopy K1 X-ray scattering K1 II-VI semiconductor materials K1 Microscopy K1 Raman scattering K1 Doping K1 Phonons K1 ZnO K1 spray pyrolysis method K1 thin films K1 Raman microscopy and spectroscopy SP 239 OP 242 LK http://dx.doi.org/https://doi.org/10.1109/CAS56377.2022.9934395 DO https://doi.org/10.1109/CAS56377.2022.9934395 SF ELIB - SuUB Bremen
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