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1 Ergebnisse
1
Impact of Electrothermal Bias Temperature Instability Stres..:
, In:
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe)
,
Gunaydin, Yasin
;
Jahdi, Saeed
;
Yuan, Xibo
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/WiPDAEurope55971.2022.9936254
RT T1
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe)
: T1
Impact of Electrothermal Bias Temperature Instability Stress on Threshold Voltage Drift of GaN Cascode Power Modules
UL https://suche.suub.uni-bremen.de/peid=ieee-9936254&Exemplar=1&LAN=DE A1 Gunaydin, Yasin A1 Jahdi, Saeed A1 Yuan, Xibo A1 Yang, Juefei A1 Yu, Renze A1 Stark, Bernard YR 2022 K1 Temperature measurement K1 MOSFET K1 Temperature distribution K1 Multichip modules K1 Logic gates K1 HEMTs K1 Silicon K1 GaN Cascode K1 threshold voltage instability K1 gate stress K1 module packaging SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/WiPDAEurope55971.2022.9936254 DO https://doi.org/10.1109/WiPDAEurope55971.2022.9936254 SF ELIB - SuUB Bremen
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