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1 Ergebnisse
1
Investigation of Repetitive Short Circuit Stress as a Degra..:
, In:
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe)
,
Yu, Renze
;
Jahdi, Saeed
;
Mellor, Phil
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/WiPDAEurope55971.2022.9936284
RT T1 <cTitle>2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe)</cTitle>: T1 <Title>Investigation of Repetitive Short Circuit Stress as a Degradation Metric in Symmetrical and Asymmetrical Double-Trench SiC Power MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9936284&Exemplar=1&LAN=DE A1 Yu, Renze A1 Jahdi, Saeed A1 Mellor, Phil A1 Yang, Juefei A1 Shen, Chengjun A1 Liu, Li A1 Alatise, Olayiwola A1 Ortiz-Gonzalez, Jose YR 2022 K1 Degradation K1 Temperature sensors K1 MOSFET K1 Silicon carbide K1 Electric shock K1 Europe K1 Voltage K1 Parameter Degradation K1 SiC MOSFET K1 Short Circuit Reliability Comparison SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/WiPDAEurope55971.2022.9936284 DO https://doi.org/10.1109/WiPDAEurope55971.2022.9936284 SF ELIB - SuUB Bremen
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