I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Analysis of 1st & 3rd Quadrant Electrothermal Robustness of..:
, In:
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe)
,
Hosseinzadehlish, Mana
;
Jahdi, Saeed
;
Yuan, Xibo
... - p. 1-6 , 2022
Link:
https://doi.org/10.1109/WiPDAEurope55971.2022.9936556
RT T1 <cTitle>2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe)</cTitle>: T1 <Title>Analysis of 1st & 3rd Quadrant Electrothermal Robustness of Symmetrical and Asymmetrical Double- Trench SiC Power MOSFETs Under UIS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9936556&Exemplar=1&LAN=DE A1 Hosseinzadehlish, Mana A1 Jahdi, Saeed A1 Yuan, Xibo A1 Shen, Chengjun A1 Gunaydin, Yasin A1 Laird, Ian A1 Alatise, Olayiwola A1 Ortiz-Gonzalez, Jose YR 2022 K1 Temperature measurement K1 MOSFET K1 Temperature distribution K1 Silicon carbide K1 Pulse measurements K1 Europe K1 Switches K1 SiC MOSFET K1 Reverse recovery K1 body diode K1 avalanche breakdown K1 electrothermal ruggedness SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/WiPDAEurope55971.2022.9936556 DO https://doi.org/10.1109/WiPDAEurope55971.2022.9936556 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
