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1 Ergebnisse
1
A CMOS-based Characterisation Platform for Emerging RRAM Te..:
, In:
2022 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Mifsud, Andrea
;
Shen, Jiawei
;
Feng, Peilong
... - p. 75-79 , 2022
Link:
https://doi.org/10.1109/ISCAS48785.2022.9937343
RT T1 <cTitle>2022 IEEE International Symposium on Circuits and Systems (ISCAS)</cTitle>: T1 <Title>A CMOS-based Characterisation Platform for Emerging RRAM Technologies</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9937343&Exemplar=1&LAN=DE A1 Mifsud, Andrea A1 Shen, Jiawei A1 Feng, Peilong A1 Xie, Lijie A1 Wang, Chaohan A1 Pan, Yihan A1 Maheshwari, Sachin A1 Agwa, Shady A1 Stathopoulos, Spyros A1 Wang, Shiwei A1 Serb, Alexander A1 Papavassiliou, Christos A1 Prodromakis, Themis A1 Constandinou, Timothy G. YR 2022 SN 2158-1525 K1 Resistance K1 Semiconductor device measurement K1 Voltage measurement K1 Circuits and systems K1 Current measurement K1 Programming K1 System-on-chip K1 ReRAM K1 RRAM K1 memristor K1 characterisation K1 array SP 75 OP 79 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS48785.2022.9937343 DO https://doi.org/10.1109/ISCAS48785.2022.9937343 SF ELIB - SuUB Bremen
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