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1 Ergebnisse
1
Bayesian Deep Active Learning for Analog Circuit Performanc..:
, In:
2022 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Zhang, Lining
;
Raju, Salahuddin
;
James, Ashish
... - p. 3018-3022 , 2022
Link:
https://doi.org/10.1109/ISCAS48785.2022.9937416
RT T1 <cTitle>2022 IEEE International Symposium on Circuits and Systems (ISCAS)</cTitle>: T1 <Title>Bayesian Deep Active Learning for Analog Circuit Performance Classification</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9937416&Exemplar=1&LAN=DE A1 Zhang, Lining A1 Raju, Salahuddin A1 James, Ashish A1 Dutta, Rahul A1 Fournier, Gregoire A1 Lancry, Damien A1 Chuan, Kevin Chai Tshun A1 Chandrasekhar, Vijay Ramaseshan A1 Foo, Chuan Sheng YR 2022 SN 2158-1525 K1 Uncertainty K1 Design automation K1 Computational modeling K1 Neural networks K1 Estimation K1 Analog circuits K1 Data models K1 analog circuit performance classification K1 electronic design automation (EDA) K1 artificial intelligence K1 neural networks K1 active learning SP 3018 OP 3022 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS48785.2022.9937416 DO https://doi.org/10.1109/ISCAS48785.2022.9937416 SF ELIB - SuUB Bremen
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