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1 Ergebnisse
1
A 40-nm CMOS Wide Input Range and Variable Gain Time-Differ..:
, In:
2022 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Lin, Li
;
Tolentino, Lean Karlo S.
;
Wang, Chua-Chin
- p. 2923-2927 , 2022
Link:
https://doi.org/10.1109/ISCAS48785.2022.9937655
RT T1
2022 IEEE International Symposium on Circuits and Systems (ISCAS)
: T1
A 40-nm CMOS Wide Input Range and Variable Gain Time-Difference Amplifier Based on Current Source Architecture
UL https://suche.suub.uni-bremen.de/peid=ieee-9937655&Exemplar=1&LAN=DE A1 Lin, Li A1 Tolentino, Lean Karlo S. A1 Wang, Chua-Chin YR 2022 SN 2158-1525 K1 Fabrication K1 Semiconductor device measurement K1 Circuits and systems K1 Current measurement K1 CMOS process K1 Time measurement K1 Delays K1 current source K1 delay K1 gain K1 phase detection K1 time amplifier SP 2923 OP 2927 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS48785.2022.9937655 DO https://doi.org/10.1109/ISCAS48785.2022.9937655 SF ELIB - SuUB Bremen
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