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A Low-Complexity Method to Address Process Variability in T..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Addabbo, T. ; Fort, A. ; Mugnaini, M.... - p. 1670-1674 , 2022
Link: https://doi.org/10.1109/ISCAS48785.2022.9937869