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1 Ergebnisse
1
Self-correcting Flip-flops for Triple Modular Redundant Log..:
, In:
2022 IEEE International Symposium on Circuits and Systems (ISCAS)
,
Clark, Lawrence T.
;
Duvnjak, Alen
;
Young-Sciortino, Clifford
... - p. 1205-1209 , 2022
Link:
https://doi.org/10.1109/ISCAS48785.2022.9937935
RT T1 <cTitle>2022 IEEE International Symposium on Circuits and Systems (ISCAS)</cTitle>: T1 <Title>Self-correcting Flip-flops for Triple Modular Redundant Logic in a 12-nm Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9937935&Exemplar=1&LAN=DE A1 Clark, Lawrence T. A1 Duvnjak, Alen A1 Young-Sciortino, Clifford A1 Cannon, Matthew A1 Brunhaver, John A1 Agarwal, Sapan A1 Neuendank, Jereme A1 Wilson, Donald A1 Barnaby, Hugh A1 Marinella, Matthew YR 2022 SN 2158-1525 K1 Protons K1 Latches K1 Systematics K1 Measurement uncertainty K1 Logic gates K1 Ions K1 Solids K1 soft errors K1 radiation hardening K1 triple modular redundancy K1 heavy ion testing K1 proton testing SP 1205 OP 1209 LK http://dx.doi.org/https://doi.org/10.1109/ISCAS48785.2022.9937935 DO https://doi.org/10.1109/ISCAS48785.2022.9937935 SF ELIB - SuUB Bremen
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