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1 Ergebnisse
1
Local nm-Scale Imaging of Electrical Contact for Series Res..:
, In:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC)
,
Jiang, C.-S.
;
Johnston, S.
;
Gauding, E.A.
... - p. 0872-0874 , 2022
Link:
https://doi.org/10.1109/PVSC48317.2022.9938916
RT T1 <cTitle>2022 IEEE 49th Photovoltaics Specialists Conference (PVSC)</cTitle>: T1 <Title>Local nm-Scale Imaging of Electrical Contact for Series Resistance Degradation of Silicon Solar Cells</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9938916&Exemplar=1&LAN=DE A1 Jiang, C.-S. A1 Johnston, S. A1 Gauding, E.A. A1 Deceglie, M.G. A1 Flottemesch, R. A1 Xiao, C. A1 Moutinho, R. A1 Sulas-Kern, D.B. A1 Mangum, J. A1 Al-Jassim, M.M. A1 Repins, I.L. YR 2022 K1 Degradation K1 Resistance K1 Photovoltaic systems K1 Shape K1 Metallization K1 Contacts K1 Microscopy K1 series resistance degradation K1 c-Si solar cell K1 front metallization K1 scanning spreading resistance microscopy (SSRM) K1 nm-scale imaging SP 0872 OP 0874 LK http://dx.doi.org/https://doi.org/10.1109/PVSC48317.2022.9938916 DO https://doi.org/10.1109/PVSC48317.2022.9938916 SF ELIB - SuUB Bremen
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