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1 Ergebnisse
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Substrate Effect on Low-frequency Noise of synaptic RRAM de..:
, In:
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)
,
Vasileiadis, Nikolaos
;
Mavropoulis, Alexandros
;
Loukas, Panagiotis
... - p. 1-5 , 2022
Link:
https://doi.org/10.1109/VLSI-SoC54400.2022.9939652
RT T1
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC)
: T1
Substrate Effect on Low-frequency Noise of synaptic RRAM devices
UL https://suche.suub.uni-bremen.de/peid=ieee-9939652&Exemplar=1&LAN=DE A1 Vasileiadis, Nikolaos A1 Mavropoulis, Alexandros A1 Loukas, Panagiotis A1 Normand, Pascal A1 Sirakoulis, Georgios Ch. A1 Dimitrakis, Panagiotis YR 2022 SN 2324-8440 K1 Performance evaluation K1 Electrodes K1 Semiconductor device measurement K1 Stochastic processes K1 Switches K1 Silicon nitride K1 Very large scale integration K1 RRAM K1 ReRAM K1 memristor K1 true random number generator K1 silicon nitride K1 resistance switching K1 noise measurements K1 random telegraph noise K1 flicker noise K1 SOI SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-SoC54400.2022.9939652 DO https://doi.org/10.1109/VLSI-SoC54400.2022.9939652 SF ELIB - SuUB Bremen
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