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1 Ergebnisse
1
Time-of-flight Extraction Method Based on Cross-correlation..:
, In:
2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
,
Yao, Jianfei
;
Gong, Yunxuan
;
Liu, Yongzhi
. - p. 396-400 , 2022
Link:
https://doi.org/10.1109/3M-NANO56083.2022.9941551
RT T1
2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
: T1
Time-of-flight Extraction Method Based on Cross-correlation for Stress Measurement
UL https://suche.suub.uni-bremen.de/peid=ieee-9941551&Exemplar=1&LAN=DE A1 Yao, Jianfei A1 Gong, Yunxuan A1 Liu, Yongzhi A1 Long, Zhili YR 2022 SN 2694-510X K1 Ultrasonic imaging K1 Transmitters K1 Noise reduction K1 Receivers K1 Nanoscale devices K1 Manufacturing K1 Noise measurement K1 stress measurement K1 signal processing K1 time-of-flight extraction K1 cross-correlation K1 wavelet noise reduction SP 396 OP 400 LK http://dx.doi.org/https://doi.org/10.1109/3M-NANO56083.2022.9941551 DO https://doi.org/10.1109/3M-NANO56083.2022.9941551 SF ELIB - SuUB Bremen
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