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1 Ergebnisse
1
FE Simulation of Dead Metal Zone Corresponding to the Micro..:
, In:
2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
,
Ren, Yongqin
;
Song, Bowen
;
Jing, Xiubing
. - p. 243-246 , 2022
Link:
https://doi.org/10.1109/3M-NANO56083.2022.9941564
RT T1 <cTitle>2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)</cTitle>: T1 <Title>FE Simulation of Dead Metal Zone Corresponding to the Micro-cutting Process</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9941564&Exemplar=1&LAN=DE A1 Ren, Yongqin A1 Song, Bowen A1 Jing, Xiubing A1 Chen, Yun YR 2022 SN 2694-510X K1 Titanium alloys K1 Semiconductor device measurement K1 Force K1 Stability analysis K1 Nanoscale devices K1 Manufacturing K1 Finite element analysis K1 micro-cutting K1 dead metal zone K1 finite element simulation K1 hard material K1 machine SP 243 OP 246 LK http://dx.doi.org/https://doi.org/10.1109/3M-NANO56083.2022.9941564 DO https://doi.org/10.1109/3M-NANO56083.2022.9941564 SF ELIB - SuUB Bremen
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