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1 Ergebnisse
1
Well layer thickness dependence on threshold current of SCH..:
, In:
2022 28th International Semiconductor Laser Conference (ISLC)
,
Yada, Ryosuke
;
Agata, Kouji
;
Zhao, Liang
... - p. 1-2 , 2022
Link:
https://doi.org/10.23919/ISLC52947.2022.9943316
RT T1 <cTitle>2022 28th International Semiconductor Laser Conference (ISLC)</cTitle>: T1 <Title>Well layer thickness dependence on threshold current of SCH-MQW laser diode grown on InP/Si substrate</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9943316&Exemplar=1&LAN=DE A1 Yada, Ryosuke A1 Agata, Kouji A1 Zhao, Liang A1 Ito, Singo A1 Aoki, Sae A1 Simomura, Kazuhiko YR 2022 K1 Semiconductor lasers K1 Threshold current K1 Diode lasers K1 III-V semiconductor materials K1 Substrates K1 Indium phosphide SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/ISLC52947.2022.9943316 DO https://doi.org/10.23919/ISLC52947.2022.9943316 SF ELIB - SuUB Bremen
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