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1 Ergebnisse
1
Testing a generalized Siegert relation for characterizing s..:
, In:
2022 28th International Semiconductor Laser Conference (ISLC)
,
Drechsler, Monty
;
Lohof, Frederik
;
Gies, Christopher
- p. 1-2 , 2022
Link:
https://doi.org/10.23919/ISLC52947.2022.9943385
RT T1
2022 28th International Semiconductor Laser Conference (ISLC)
: T1
Testing a generalized Siegert relation for characterizing semiconductor nanolaser emission
UL https://suche.suub.uni-bremen.de/peid=ieee-9943385&Exemplar=1&LAN=DE A1 Drechsler, Monty A1 Lohof, Frederik A1 Gies, Christopher YR 2022 K1 Semiconductor device modeling K1 Semiconductor device measurement K1 Correlation K1 Semiconductor lasers K1 Stimulated emission K1 Quantum mechanics K1 Optical variables measurement K1 Nanolaser K1 quantum optics K1 photon correlations SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/ISLC52947.2022.9943385 DO https://doi.org/10.23919/ISLC52947.2022.9943385 SF ELIB - SuUB Bremen
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