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1 Ergebnisse
1
Interference effect in deep-ultraviolet light emitting diod..:
, In:
2022 28th International Semiconductor Laser Conference (ISLC)
,
Iwatsuki, Rie
;
Ishiguro, Hisanori
;
Fujita, Maho
... - p. 1-2 , 2022
Link:
https://doi.org/10.23919/ISLC52947.2022.9943398
RT T1 <cTitle>2022 28th International Semiconductor Laser Conference (ISLC)</cTitle>: T1 <Title>Interference effect in deep-ultraviolet light emitting diodes with p-AlGaN contact layers and ITO/Al electrodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9943398&Exemplar=1&LAN=DE A1 Iwatsuki, Rie A1 Ishiguro, Hisanori A1 Fujita, Maho A1 Kamiyama, Satoshi A1 Iwaya, Motoaki A1 Takeuchi, Tetsuya A1 Nagata, Kengo A1 Okuno, Koji A1 Saito, Yoshiki YR 2022 K1 Electrodes K1 Semiconductor device measurement K1 Semiconductor lasers K1 Measurement by laser beam K1 Interference K1 Light emitting diodes K1 Wide band gap semiconductors K1 DUV LED K1 interference effect K1 AlGaN contact layer K1 ITO/Al electrode SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/ISLC52947.2022.9943398 DO https://doi.org/10.23919/ISLC52947.2022.9943398 SF ELIB - SuUB Bremen
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