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1 Ergebnisse
1
Full-scale exfoliation of InGaN-based light-eMitting diodes..:
, In:
2022 28th International Semiconductor Laser Conference (ISLC)
,
Min, Jung-Hong
;
Jeong, Tae-Hoon
;
Lee, Kwang Jae
... - p. 1-2 , 2022
Link:
https://doi.org/10.23919/ISLC52947.2022.9943440
RT T1 <cTitle>2022 28th International Semiconductor Laser Conference (ISLC)</cTitle>: T1 <Title>Full-scale exfoliation of InGaN-based light-eMitting diodes via Microcavity-assisted crack propagation by using tensile-stressed Ni layers</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9943440&Exemplar=1&LAN=DE A1 Min, Jung-Hong A1 Jeong, Tae-Hoon A1 Lee, Kwang Jae A1 Min, Jung-Wook A1 Park, Tae-Yong A1 Ng, Tien Khee A1 Ooi, Boon S. YR 2022 K1 Semiconductor lasers K1 Glass K1 Light emitting diodes K1 Nickel K1 Nanostructures K1 Bonding SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/ISLC52947.2022.9943440 DO https://doi.org/10.23919/ISLC52947.2022.9943440 SF ELIB - SuUB Bremen
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