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1 Ergebnisse
1
Characteristics of Self-scanning Addressable VCSEL array fo..:
, In:
2022 28th International Semiconductor Laser Conference (ISLC)
,
Kondo, T.
;
Hayakawa, J.
;
Murata, M.
... - p. 1-2 , 2022
Link:
https://doi.org/10.23919/ISLC52947.2022.9943494
RT T1 <cTitle>2022 28th International Semiconductor Laser Conference (ISLC)</cTitle>: T1 <Title>Characteristics of Self-scanning Addressable VCSEL array for Time of Flight</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9943494&Exemplar=1&LAN=DE A1 Kondo, T. A1 Hayakawa, J. A1 Murata, M. A1 Iguchi, D. A1 Sakita, T. A1 Higuchi, T. A1 Takeyama, K. A1 Ohno, S. A1 Usami, H. YR 2022 K1 Reflectivity K1 Semiconductor device measurement K1 Power measurement K1 Power demand K1 Stimulated emission K1 Shape K1 Ultraviolet sources K1 Vertical-cavity surface-emitting laser K1 monolithically integrated K1 self-scanning K1 thyristor K1 Time of flight SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.23919/ISLC52947.2022.9943494 DO https://doi.org/10.23919/ISLC52947.2022.9943494 SF ELIB - SuUB Bremen
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