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Degradation Mechanism and Failure Analysis of Planar Type S..:

, In: 2022 13th International Conference on Reliability, Maintainability, and Safety (ICRMS),
Lin, Yihang ; Chen, Y. Q. ; Geng, Kuiwei. - p. 135-139 , 2022
Link: https://doi.org/10.1109/ICRMS55680.2022.9944567