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1 Ergebnisse
1
Few-Shot Learning based on Residual Neural Networks for X-r..:
, In:
2022 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
,
Abdrakhmanov, Rakhat
;
Viderman, Dmitriy
;
Wong, Kok-Seng
. - p. 1817-1821 , 2022
Link:
https://doi.org/10.1109/SMC53654.2022.9945469
RT T1
2022 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
: T1
Few-Shot Learning based on Residual Neural Networks for X-ray Image Classification
UL https://suche.suub.uni-bremen.de/peid=ieee-9945469&Exemplar=1&LAN=DE A1 Abdrakhmanov, Rakhat A1 Viderman, Dmitriy A1 Wong, Kok-Seng A1 Lee, Minho YR 2022 SN 2577-1655 K1 COVID-19 K1 Training K1 Deep learning K1 Visualization K1 Stochastic processes K1 Radiology K1 Feature extraction K1 Computer Vision K1 Deep Learning K1 Few-Shot Learning K1 X-ray SP 1817 OP 1821 LK http://dx.doi.org/https://doi.org/10.1109/SMC53654.2022.9945469 DO https://doi.org/10.1109/SMC53654.2022.9945469 SF ELIB - SuUB Bremen
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