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Fault Resilience Techniques for Flash Memory of DNN Acceler..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Lu, Shyue-Kung ; Wu, Yu-Sheng ; Hong, Jin-Hua. - p. 1-6 , 2022
Link: https://doi.org/10.1109/ITCAsia55616.2022.00011